Product Details

SMSW-040

Spectrophotometer UV-VIS Double Beam Microprocessor

The technique has enjoyed a molecular biology and the need to quantity DNA and proteins.

Here, the simplicity of use, the non-destructive nature of the sampling and the cost effectiveness of the measurement has proved very beneficial in the modern laboratory.
Maximum of 9 Wavelengths and 1 Samples can be measured at one time.
Special Feature : Facility provided with DNA Protein Test.
Accessories : Glass Cells - 16 Nos, Quartz Cell-4 Nos, Instrument Cover-1 No. Software CD-1 No., Rs232 Cable-1No., Operation Manual-1 No.

Please contact SMSW for current configuration and ordering details.

Specification	Details
Wavelength Range	190 to 1100 nm
Spectral Bandwidth	1 nm
Scanning Speed	Fast/Medium/Slow
Photometric Range	-0.3
Working Mode	T, A, C, E
Wavelength Accuracy	± 0.3 nm
Baseline Flatness	± 0.002 A (0~100%T)
Optical System	Double Beam
Detector	Dual Silicon Photodiode
Display	6” High Light Blue LCD
Photometric Accuracy	± 0.3% T (0~100%T), ± 0.002 A (0~100%T)
Wavelength Reproducibility	<0.10 nm
Photometric Reproducibility	<0.15%T
Stray Light	<0.1% T (Nal. 220nm, NaNo 2 340 nm)
Stability	<0.001 A/h (At 500 nm, after warming up)
Noise	± 0.001 A (At 500 nm, after warming up)
Power Supply	230V AC ± 10%, 50 Hz

SMSW-040

The technique has enjoyed a molecular biology and the need to quantity DNA and proteins.

Here, the simplicity of use, the non-destructive nature of the sampling and the cost effectiveness of the measurement has proved very beneficial in the modern laboratory.
Maximum of 9 Wavelengths and 1 Samples can be measured at one time.
Special Feature : Facility provided with DNA Protein Test.
Accessories : Glass Cells - 16 Nos, Quartz Cell-4 Nos, Instrument Cover-1 No. Software CD-1 No., Rs232 Cable-1No., Operation Manual-1 No.

Please contact SMSW for current configuration and ordering details.

Specification	Details
Wavelength Range	190 to 1100 nm
Spectral Bandwidth	1 nm
Scanning Speed	Fast/Medium/Slow
Photometric Range	-0.3
Working Mode	T, A, C, E
Wavelength Accuracy	± 0.3 nm
Baseline Flatness	± 0.002 A (0~100%T)
Optical System	Double Beam
Detector	Dual Silicon Photodiode
Display	6” High Light Blue LCD
Photometric Accuracy	± 0.3% T (0~100%T), ± 0.002 A (0~100%T)
Wavelength Reproducibility	<0.10 nm
Photometric Reproducibility	<0.15%T
Stray Light	<0.1% T (Nal. 220nm, NaNo 2 340 nm)
Stability	<0.001 A/h (At 500 nm, after warming up)
Noise	± 0.001 A (At 500 nm, after warming up)
Power Supply	230V AC ± 10%, 50 Hz